Publications


Postdoctoral Work (Fritz Haber Institute of the Max Planck Society)

  1. K-L. C. Nguyen, J. P. Bruce, A. Yoon, J. J. Navarro, F. Scholten, F. Landwehr, C. Rettenmaier, M. Heyde, B. Roldan Cuenya; The Influence of Mesoscopic Surface Structure on the Electrocatalytic Selectivity of CO2 Reduction with UHV-Prepared Cu(111) Single Crystals, ACS Energy Lett., 2024, 9, 2, 644-622
  2. J. N. Navarro, M. Das, S. Tosoni, F. Landwehr, J. P. Bruce, M. Heyde, G. Pacchioni, F. Glorius, B. Roldan Cuenya; Covalent Adsorption of N-Heterocyclic Carbenes on a Copper Oxide Surface, J. Am. Chem. Soc., 2022, 144, 36, 16267-16271
  3. J. P. Bruce, K-L. C. Nguyen, F. Scholten, R. M. Aran Ais, J. J. Navarro, J. Hartmann, M. Heyde, B. Roldan Cuenya; Development of a Single Crystal Sample Holder for Interfacing Ultra-High Vacuum with Electrochemical Experimentation, Rev. Sci. Inst, 2021,92, 074104
  4. F. Scholten, K-L.C. Nguyen, J. P. Bruce, M. Heyde, B. Roldan Cuenya; Identifying Structure Selectivity Correlations in the Electrochemical Reduction of CO2: A Comparison of Well-Ordered, Atomically Clean and Chemically Etched Cu Single Crystal Surfaces, Angew. Chem. Int. Ed., 2021, 60, 2 – 9 (Very Important Paper)
  5. J. J. Navarro, S. Tosoni, J. P. Bruce, L. Chaves, M. Heyde, G. Pacchioni, B. Roldan Cuenya; The Structure of a Silica Thin Film on Oxidized Cu (111): Conservation of Honeycomb Lattice and Role of the Interlayer, J. Phys Chem C., 2020, 124, 38, 20942-20949

Doctoral Work (University of California, Irvine)

  1. J. P. Bruce, K. Zhang, S. Balasubramani, A.R. Haines, R.P. Galhenage, V. Voora, F. Furche, J. C. Hemminger; Exploring the Solvation of Acetic Acid in Water Using Liquid Jet X-ray Photoelectron Spectroscopy and Core Level Electron Binding Energy Calculations, J. Phys. Chem. B., 2021, 125, 31, 8862-8868
  2. J. P. Bruce,* D. N. Huh,* S. G. Balasubramanai, S. R. Ciccone, F. Furche, J. C. Hemminger, W. J. Evans; High-Resolution X-ray Photoelectron Spectroscopy of Organometallic (C5H4SiMe3)3LnIII and [(C5H4SiMe3)3LnII]1– Complexes (Ln = Sm, Eu, Gd, Tb), J. Am. Chem. Soc., 143, 40, 16610-16620
  3. J. P. Bruce, J.C. Hemminger; Characterization of Fe2+ Aqueous Solutions with Liquid Jet X-ray Photoelectron Spectroscopy: Chloride Depletion at the Liquid/Vapor Interface Due to Complexation with Fe2+, J. Phys. Chem. B, 2019, 123, 39, 8285 – 8290
  4. D. Ferrah, A.R. Haines, R. P. Galhenage, J. P. Bruce, A. D. Babore, A. Hunt, I. Waluyo, J. C. Hemminger; Wet Chemical Growth and Thermo-Catalytic Activity of Cu-based Nanoparticles Supported of TiO2 Nanoparticles/HOPG: In Situ Ambient Pressure XPS Study of CO2 Hydrogenation Reaction ACS Catalysis, 2019, 9, 8, 6783-6802

Masters Work (University of Manitoba)

  1. K. McEleney, J. P. Bruce, M.S. Freund; Characterization of High-Aspect Ratio Periodic Structures by X – ray Photoelectron Spectroscopy. Surface and Interface Analysis Surface and Interface Analysis, 2017, 49, 503 – 514
  2. A. Gupta, J. P. Bruce, K. McEleney, M.S. Freund, D.R. Oliver; Important Monohydride Predictor for Successful Si(110) Surface Functionalization.  RSC Advances, 2016, 6, 88239
  3. J. P. Bruce,* P. K. Giesbrecht*; M. S. Freund; Electrical Behavior of Thiophene and 3, 4-Ethylenedioxythiophene Functionalized Planar n – Si/PEDOT:PSS Junctions for Artificial Photosynthetic Applications ChemSusChem, 2016, 9 (1), 109 – 117
  4. O. S. Kang, J. P. Bruce, D. E. Herbert, M. S. Freund; Covalent Attachment of Ferrocene to Silicon Microwire Arrays ACS Appl. Mater. and Interfaces, 2015, 7 (48), 26959 – 26967
  5. J. P. Bruce, D. R. Oliver, N. S. Lewis, M. S. Freund; Electrical Characterization of the Junction Between PEDOT:PSS and Thiophene-Functionalized Silicon Microwires ACS Appl. Mater. and Interfaces, 2015, 7 (49), 27160 – 27166
  6. M. McDonald, J. P. Bruce, K. McEleney, M. S. Freund; Reduced Graphene Oxide Membranes for Integrated Solar Water Splitting in Optimal OER and HER pH ChemSusChem, 2015, 8 (16), 2645 – 2652; (Back Cover Article)
  7. M. M. McClarty, J. P. Bruce, M. S. Freund, D. R. Oliver; Piezoresistive Characterization of Bottom-up, n-type Silicon Microwires Undergoing Bend Deformation Appl. Phys. Lett. 2015, 106 (2), 022107
  8. J. P. Bruce, S. Asgari, S. Ardo, N. S. Lewis, D. R. Oliver, M. S. Freund; Measurement of the Electrical Resistance of n-type Si Microwire/p-type Conducting Polymer Junctions for Use in Artificial Photosynthesis J. Phys. Chem. C. 2014,118 (48), 27742-27748
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